March 6, 2019
This video demonstrates how Qorvo determines reliability and thermal resistance for GaN devices. You can also refer to the GaN application note GaN Device Channel Temperature, Thermal Resistance, and Reliability Estimates for a more detailed explanation. We also have a Qorvo GaN transistor model library which contains a powerful collection of high-accuracy nonlinear simulation models for die-and package-format GaN transistors from Qorvo. With an array of tools like this video in our Design Hub, we’ll help you be faster and smarter. We love partnering on the toughest RF problems. Think of us as your Smartner™ — your smart RF partner. If you need further support, please contact firstname.lastname@example.org.